Journal Article
Park, M. H.; Chung, C.-C.; Schenk, T.; Richter, C.; Hoffmann, M.; Wirth, S.; Jones, J. L.; Mikolajick, T.; Schroeder, U.: Origin of Temperature-Dependent Ferroelectricity in Si-Doped HfO
2. Advanced Electronic Materials
4 (4), 1700489, pp. 1 - 8 (2018)