Journal Article
Usachov, D. Y.; Tarasov V, A.; Schulz, S.; Bokai, K. A.; Tupitsyn, I. I.; Poelchen, G.; Seiro, S.; Caroca-Canales, N.; Kliemt, K.; Mende, M. et al.; Kummer, K.; Krellner, C.; Muntwiler, M.; Li, H.; Laubschat, C.; Geibel, C.; Chulkov V, E.; Fujimori I, S.; Vyalikh, D. V.: Photoelectron diffraction for probing valency and magnetism of 4 f-based materials: A view on valence-fluctuating EuIr
2Si
2. Physical Review B
102 (20), 205102, pp. 1 - 11 (2020)