Publications of Jacob Gayles

Winter, M.; Goncalves, F. J. T.; Soldatov, I.; He, Y.; Zúñiga Céspedes, B. E.; Milde, P.; Lenz, K.; Hamann, S.; Uhlarz, M.; Vir, P. et al.; König, M.; Moll, P. J. W.; Schlitz, R.; Goennenwein, S. T. B.; Eng, L. M.; Schäfer, R.; Wosnitza, J.; Felser, C.; Gayles, J.; Helm, T.: Antiskyrmions and their electrical footprint in crystalline mesoscale structures of Mn_1.4PtSn. Communications Materials 3, 102, pp. 1 - 9 (2022)

Markou, A.; Gayles, J.; Derunova, E.; Swekis, P.; Noky, J.; Zhang, L.; Ali, M. N.; Sun, Y.; Felser, C.: Hard magnet topological semimetals in XPt₃ compounds with the harmony of Berry curvature. Communications Physics 4, 104, pp. 1 - 7 (2021)

Park, G.-H.; Reichlova, H.; Schlitz, R.; Lammel, M.; Markou, A.; Swekis, P.; Ritzinger, P.; Kriegner, D.; Noky, J.; Gayles, J. et al.; Sun, Y.; Felser, C.; Nielsch, K.; Goennenwein, S. T. B.; Thomas, A.: Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl semimetal Co₂MnGa thin films. Physical Review B 101 (6), 060406, pp. 1 - 7 (2020)

Kumar, V.; Kumar, N.; Reehuis, M.; Gayles, J.; Sukhanov, A. S.; Hoser, A.; Damay, F.; Shekhar, C.; Adler, P.; Felser, C.: Detection of antiskyrmions by topological Hall effect in Heusler compounds. Physical Review B 101 (1), 014424, pp. 1 - 9 (2020)

Vir, P.; Gayles, J.; Sukhanov, A. S.; Kumar, N.; Damay, F.; Sun, Y.; Kübler, J.; Shekhar, C.; Felser, C.: Anisotropic topological Hall effect with real and momentum space Berry curvature in the antiskrymion-hosting Hensler compound Mn_1.4PtSn. Physical Review B 99 (14), 140406, pp. 1 - 5 (2019)

Schlitz, R.; Swekis, P.; Markou, A.; Reichlova, H.; Lammel, M.; Gayles, J.; Thomas, A.; Nielsch, K.; Felser, C.; Goennenwein, S. T. B.: All Electrical Access to Topological Transport Features in Mn_1.8PtSn Films. Nano Letters 19 (4), pp. 2366 - 2370 (2019)

Swekis, P.; Markou, A.; Kriegner, D.; Gayles, J.; Schlitz, R.; Schnelle, W.; Goennenwein, S. T. B.; Felser, C.: Topological Hall effect in thin films of Mn_1.5PtSn. Physical Review Materials 3 (1), 013001, pp. 1 - 5 (2019)